March 18, 2010

The rapid spread of the Internet and increases in network transmission capacity are driving development and manufacturing of FTTx and 10-Gbit Ethernet devices. As a result, R&D into high-speed transmission technologies and manufacturing of high-speed devices are both progressing at a fast pace. To assure the integrity of signals passing via these high-speed devices, the bit error rate (BER) and eye pattern are measured using a BERT and sampling scope. The all-in-one MP2100A BERTWave series supporting simultaneous BER and eye-pattern measurements is ideal for both R&D and manufacturing tests because it increases efficiency and cuts measurement costs by eliminating timeconsuming setup.

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